INDEX-2
Component testing—Continued
automatic test equipment, 2-38 to
2-39
optical multimeter, 2-38
optical ohmmeter, 2-38
optical power meter, 2-38
optical time-domain reflectometer
(OTDR), 2-38
oscilloscope, 2-38
radiometer/photometer, 2-38
integrated circuit (IC) testing, 2-28 to
2-34
logic analyzer, 2-32
logic clips, 2-29
logic comparators, 2-29
logic probes, 2-30 to 2-31
logic pulsers, 2-31
introduction to component testing, 2-1
rf attenuators and resistive load tests,
2-34 to 2-37
50/75-ohm terminations, 2-36
decade resistors, 2-35
decade (step) attenuators, 2-36
fixed rf attenuators, 2-35
summary, 2-43 to 2-48
testing electron tubes, 2-1 to 2-8
electron tube testers, 2-3 to 2-6
auxiliary compartment, 2-4 to
2-5
front panel, 2-3 to 2-4
operation, 2-5 to 2-6
program cards, 2-5
high-power hf amplifier tube tests,
2-6 to 2-8
crossed-field amplifier, 2-8
klystron tube tests, 2-6 to 2-7
magnetron tube tests, 2-8
traveling-wave tube, 2-7 to 2-8
substitution methods, 2-2 to 2-3
testing semiconductors, 2-8 to 2-27
diode characteristic graphical
display, 2-17 to 2-19
reverse voltage-current analysis,
2-18 to 2-19
zener diode test, 2-20
diode testers, 2-16 to 2-17
Component testing—Continued
rf diode test, 2-16
switching diode test, 2-17
diode testing, 2-16
field-effect transistor (FET) tests,
2-23 to 2-27
N-channel test, 2-25
P-channel test, 2-25
MOSFET testing, 2-25 to 2-27
MOSFET
(depletion/enhancement type)
test, 2-27
MOSFET (enhancement type)
test, 2-27
silicon-controlled rectifiers (SCR),
2-21
static resistance measurements, 2-20
transistor testing, 2-9 to 2-16
electrostatic discharge sensitive
(ESDS) care, 2-12 to 2-15
resistance test, 2-9
transistor testers, 2-10 to 2-12
triac, 2-22
unijunction transistors (UJTs), 2-22
Composite-coil, iron-core, and torsion-head
wattmeters, 3-15
Counter method, frequency, 3-32
Cross-modulation and parasitic generation,
4-11
Cross-field amplifier, 2-8
Current measurement, 1-8 to 1-12
D
Dc voltage measurements, 1-3 to 1-6
Decibel meters, 3-12
Differential voltmeters, 1-14
Diode characteristic graphical display, 2-17 to
2-19
reverse voltage-current analysis, 2-18 to
2-19
zener diode test, 2-20
Diode testers, 2-16 to 2-17
rf diode test, 2-16
switching diode test, 2-17
Dry batteries, 2-33
