INDEX-3 Miscellaneous measurements—Continued cavity wavemeter, 2-16 decibel system, 2-2 electrical output frequency, 2-12 electronic frequency counters, 2-16 frequencies above the audio range, 2-15 frequency measurements, 2-7 heterodyne frequency meters, 2-13 measurement methods, 2-4 mechanical-rotation frequency measurement, 2-8 power measurements, 2-1 power supply checks, 2-22 resistance checks, 2-23 stroboscope, 2-10 tachometer, 2-8 testing diodes, 2-20 testing diodes with an ohmmeter, 2-20 testing semiconductor devices, 2-19 testing transistors, 2-22 testing with oscilloscopes, 2-20 thermistor bridge, 2-6 transistor checks, 2-23 tuned circuits, 2-13 use of the oscilloscope, 2-17, 6-27 use of the spectrum analyzer, 2-18 visual inspection, 2-23 voltage checks, 2-23 waveform analysis, 2-17 Multimeters, 4-1 O Ohmmeter, 3-17 Oscilloscope control components, 6-10 Oscilloscope, the, 6-1 accessories, 6-35 attenuator control, 6-18 beam deflection plate action, 6-7 beam finder, 6-15 cathode and control grid, 6-2 cathode-ray tubes, 6-1 components used to adjust CRT display quality, 6-13 components used to calibrate the probe of the scope, 6-26 Oscilloscope—Continued components used to determine amplitude of a signal, 6-16 components used to determine period time of the display, 6-20 components used to display the waveform, 6-12 components used to provide a stable display, 6-22 components used to select horizontal deflection mode, 6-25 components used to select scope triggering, 6-25 components used to select vertical deflection operating mode, 6-30 components used to select vertical operating mode, 6-19 coupling, 6-24 CRT designations, 6-10 CRT graticule, 6-10 dual-trace capability, 6-30 electron beam deflection system, 6-3 electron gun, 6-2 electrostatic lenses and focusing, 6-2 factors influencing deflection, 6-4 focus control and astigmatism control,      6-14 horizontal and vertical position controls,    6-15 input connector, 6-17 intensity control, 6-14 number of cycles on the screen, 6-28 obtaining a pattern on the screen, 6-28 oscilloscope control components, 6-10 other dual-trace oscilloscope controls, 6-34 similarities among oscilloscopes, 6-27 source, 6-23 trace rotation control, 6-15 trigger level/slope, 6-23 turning on the scope, 6-28 using the oscilloscope, 6-27 vertical and horizontal plates, 6-6 vertical position control, 6-17 Output voltage measurement, 4-9