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ASSIGNMENT 2
Textbook assignment: Chapter 2, “Component Testing,” pages 2-8 through 2-48. Chapter 3,
“Quantitative Measurements,” pages 3-1 through 3-15.
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2-1. Which of the following servicing
techniques applies to semiconductors?
1. Substituting a semiconductor with a
known good semiconductor is a
simple way to test them
2. Voltage and resistance measurements
are taken prior to substituting
semiconductors
3. Substituting semiconductors is
cumbersome if more than one is bad
or if they are soldered into the circuit
4. All of the above
2-2. What minimum ratio of back-to-forward
resistance should you expect when
testing a diode?
1. 1 to 1
2. 10 to 1
3. 50 to 1
4. 100 to 1
2-3. Which of the following characteristics of
a diode cannot be determined by using a
multimeter?
1. How the diode reacts to various
voltages
2. How the diode reacts to various
frequencies
3. Both 1 and 2 above
4. How the diode reacts to forward and
reverse dc biasing
2-4. How are SCRs normally used in the
Navy?
1. As rectifiers
2. As power control devices
3. As voltage regulators
4. As switching diodes in digital
applications
Figure 2A. —Testing an SCR with an ohmmeter.
IN ANSWERING QUESTIONS 2-5 AND 2-6,
REFER TO FIGURE 2A. NOTE THAT THE
CONNECTIONS OF THE OHMMETER ARE
ALREADY MADE.
2-5. To forward bias an SCR, which elements
should you short together?
1. The gate and anode
2. The cathode and anode
3. The cathode and gate
4. All three elements
2-6. What, if anything, will be the result of
removing the short after it has been
made?
1. Current flow from the cathode to the
anode will stop
2. Current flow from the anode to the
cathode will stop
3. Current can flow in either direction
between the anode and cathode
4. Nothing
