2-47
ANSWERS TO QUESTIONS Q1. THROUGH Q33.
A-1.
Lack of adequate storage space.
A-2.
Open filaments.
A-3.
Testing the tube in its circuit.
A-4.
In their circuit.
A-5.
Restore it to serviceable condition by operating it temporarily at reduced beam voltage.
A-6.
Correct gain figure.
A-7.
Rugged design.
A-8.
Sensitive to heat and minor overloads.
A-9.
Any range setting that produces a current flow through the transistor that exceeds 1 milliamp
(usually R x 1 range).
A-10.
3,500 to 4,000 volts.
A-11.
35 volts.
A-12.
For your own safety.
A-13.
Voltages and resistances.
A-14.
Greater than 10 to 1.
A-15.
Gate and anode.
A-16.
Current is allowed to flow in either direction.
A-17.
Solder suckers create an electrostatic charge capable of damaging a MOSFET.
A-18.
Low power consumption, compact size, and lower cost.
A-19.
ICs cannot be repaired. All you need to test is output versus input.
A-20.
A "1" or "0."
A-21.
A "1" state.
A-22.
A difference in logic states between the reference IC and the IC under test.
A-23.
They provide you with a visual indication of the logic state at any point you choose in the
circuit.
A-24.
10 feet.
A-25.
A battery test set will test batteries under load conditions.
A-26.
At 1.1 volts.
