Quantcast INTEGRATED CIRCUIT (IC) TESTING

Share on Google+Share on FacebookShare on LinkedInShare on TwitterShare on DiggShare on Stumble Upon
Custom Search
 
  
 
2-28 INTEGRATED CIRCUIT (IC) TESTING Integrated circuits (ICs) constitute an area of microelectronics in which many conventional electronic components are combined into high-density modules. Integrated circuits are made up of active and passive components, such as transistors, diodes, resistors, and capacitors. Because of their reduced size, use of integrated circuits can simplify otherwise complex systems by reducing the number of separate components and interconnections. Their use can also reduce power consumption, reduce the overall size of the equipment, and significantly lower the overall cost of the equipment concerned. Many types of integrated circuits are ESDS devices and should be handled accordingly. Q-18. Name two advantages in using ICs. Your IC testing approach needs to be somewhat different from that used in testing vacuum tubes and transistors. The physical construction of ICs is the prime reason for this different approach. The most frequently used ICs are manufactured with either 14 or 16 pins, all of which may be soldered directly into the circuit. It can be quite a job for you to unsolder all of these pins, even with the special tools designed for this purpose. After unsoldering all of the pins, you then have the tedious job of cleaning and straightening all of them. Although there are a few IC testers on the market, their applications are limited. Just as transistors must be removed from the circuit to be tested, some ICs must also be removed to permit testing. When ICs are used in conjunction with external components, the external components should first be checked for proper operation. This is particularly important in linear applications where a change in the feedback of a circuit can adversely affect operating characteristics of the component. Any linear (analog) IC is sensitive to its supply voltage. This is especially the case among ICs that use bias and control voltages in addition to a supply voltage. If you suspect a linear IC of being defective, all voltages coming to the IC must be checked against the manufacturer’s circuit diagram of the equipment for any special notes on voltages. The manufacturer’s handbook will also give you recommended voltages for any particular IC. When troubleshooting ICs (either digital or linear), you cannot be concerned with what is going on inside the IC. You cannot take measurements or conduct repairs inside the IC. You should, therefore, consider the IC as a black box that performs a certain function. You can check the IC, however, to see that it can perform its design functions. After you check static voltages and external components associated with the IC, you can check it for dynamic operation. If it is intended to function as an amplifier, then you can measure and evaluate its input and output. If it is to function as a logic gate or combination of gates, it is relatively easy for you to determine what inputs are required to achieve a desired high or low output. Examples of different types of ICs are provided in figure 2-23. Figure 2-23.—Types of ICs.


Electrical News
25G Ethernet Looks Back to Future
The chairman of the group that set 40 and 100...
eetimes.com
Introducing FPGA-Based Acceleration for High-Frequency Trading
Handling market data is of highest merit and demands the...
eetimes.com
GM's Powermat Deal Falls Short
General Motors recently announced that it will include multimode wireless...
eetimes.com
Repurposing an FM Radio Chip for an RC Submarine Receiver Project
Adam is currently working on a 75MHz receiver for his...
eetimes.com
IoT Spec Taps Internet Protocol
The IPSO Alliance will release a reference architecture for an...
eetimes.com
Micron Makes Monolithic 8GB DDR3
Using a 25 nm manufacturing process, Micron has created a...
eetimes.com
Memory System Design Methods
Are you working with DDR4? Interested in NVDIMMs? Designing at...
eetimes.com
Makimoto's Wave Revisited for Multicore SoC Design
So predictable was the cycle of standardization and customization in...
eetimes.com
Mobile Benchmarks Need Work
The industry needs to put more effort into building better...
eetimes.com
EEVblog #645 – TRS-80 Model I Retro Computer Teardown
Dave looks inside the most popular microcomputer of the 1970′s,...
eevblog.com
Wearables Sing in Smart Clothes
The future of mainstream wearable technology may be driven by...
eetimes.com
ST Opens MEMS Microphone Test Laboratory
STMicroelectronics NV has set up an anechoic chamber in Taipei,...
eetimes.com
Power Tip 73: Synchronizing Makes for Well-Behaved Power Supplies
Synchronizing your power system offers a number of benefits, including...
eetimes.com
7 Insurance Issues With Your Self-Driving Car
People talk about the significant reduction in automotive insurance rates...
eetimes.com
Microsemi Bolsters FPGA Stance With Mingoa Acquisition
The Mingoa deal demonstrates Microsemi's push to gain market share...
eetimes.com
FAA Rules on Drones vs. Model Aircraft Contested
Proposed FAA dividing line between model aircraft and drones is...
eetimes.com
Think Different, Innovate by Reuse
It's time we slow down the fevered pace of new...
eetimes.com
Space Business Rising, Experts Say
The emerging commercial space sector is making progress but still...
eetimes.com
Connecting Islands of Industrial IoT
The Industrial Internet of Things often starts with a wealth...
eetimes.com
Graphene / Lithium Ion Capacitor Kickstarter BS
I’ve had a lot of people ask me to comment...
eevblog.com
 


Privacy Statement - Copyright Information. - Contact Us

comments powered by Disqus

Integrated Publishing, Inc.
9438 US Hwy 19N #311 Port Richey, FL 34668

Phone For Parts Inquiries: (727) 755-3260
Google +