2-47 ANSWERS TO QUESTIONS Q1. THROUGH Q33. A-1. Lack of adequate storage space. A-2. Open filaments. A-3. Testing the tube in its circuit. A-4. In their circuit. A-5. Restore it to serviceable condition by operating it temporarily at reduced beam voltage. A-6. Correct gain figure. A-7. Rugged design. A-8. Sensitive to heat and minor overloads. A-9. Any range setting that produces a current flow through the transistor that exceeds 1 milliamp (usually R x 1 range). A-10. 3,500 to 4,000 volts. A-11. 35 volts. A-12. For your own safety. A-13. Voltages and resistances. A-14. Greater than 10 to 1. A-15. Gate and anode. A-16. Current is allowed to flow in either direction. A-17. Solder suckers create an electrostatic charge capable of damaging a MOSFET. A-18. Low power consumption, compact size, and lower cost. A-19. ICs cannot be repaired. All you need to test is output versus input. A-20. A "1" or "0." A-21. A "1" state. A-22. A difference in logic states between the reference IC and the IC under test. A-23. They provide you with a visual indication of the logic state at any point you choose in the circuit. A-24. 10 feet. A-25. A battery test set will test batteries under load conditions. A-26. At 1.1 volts.