INDEX-2 Component testing—Continued automatic test equipment, 2-38 to     2-39 optical multimeter, 2-38 optical ohmmeter, 2-38 optical power meter, 2-38 optical time-domain reflectometer (OTDR), 2-38 oscilloscope, 2-38 radiometer/photometer, 2-38 integrated circuit (IC) testing, 2-28 to     2-34 logic analyzer, 2-32 logic clips, 2-29 logic comparators, 2-29 logic probes, 2-30 to 2-31 logic pulsers, 2-31 introduction to component testing, 2-1 rf attenuators and resistive load tests,      2-34 to 2-37 50/75-ohm terminations, 2-36 decade resistors, 2-35 decade (step) attenuators, 2-36 fixed rf attenuators, 2-35 summary, 2-43 to 2-48 testing electron tubes, 2-1 to 2-8 electron tube testers, 2-3 to 2-6 auxiliary compartment, 2-4 to   2-5 front panel, 2-3 to 2-4 operation, 2-5 to 2-6 program cards, 2-5 high-power hf amplifier tube tests,   2-6 to 2-8 crossed-field amplifier, 2-8 klystron tube tests, 2-6 to 2-7 magnetron tube tests, 2-8 traveling-wave tube, 2-7 to 2-8 substitution methods, 2-2 to 2-3 testing semiconductors, 2-8 to 2-27 diode characteristic graphical display, 2-17 to 2-19 reverse voltage-current analysis, 2-18 to 2-19 zener diode test, 2-20 diode testers, 2-16 to 2-17 Component testing—Continued rf diode test, 2-16 switching diode test, 2-17 diode testing, 2-16 field-effect transistor (FET) tests,     2-23 to 2-27 N-channel test, 2-25 P-channel test, 2-25 MOSFET testing, 2-25 to 2-27 MOSFET (depletion/enhancement type) test, 2-27 MOSFET (enhancement type) test, 2-27 silicon-controlled rectifiers (SCR),   2-21 static resistance measurements, 2-20 transistor testing, 2-9 to 2-16 electrostatic discharge sensitive (ESDS) care, 2-12 to 2-15 resistance test, 2-9 transistor testers, 2-10 to 2-12 triac, 2-22 unijunction transistors (UJTs), 2-22 Composite-coil, iron-core, and torsion-head wattmeters, 3-15 Counter method, frequency, 3-32 Cross-modulation and parasitic generation,    4-11 Cross-field amplifier, 2-8 Current measurement, 1-8 to 1-12 D Dc voltage measurements, 1-3 to 1-6 Decibel meters, 3-12 Differential voltmeters, 1-14 Diode characteristic graphical display, 2-17 to 2-19 reverse voltage-current analysis, 2-18 to 2-19 zener diode test, 2-20 Diode testers, 2-16 to 2-17 rf diode test, 2-16 switching diode test, 2-17 Dry batteries, 2-33