Quantcast Figure 2-7.Cutoff in a conventional tube

Share on Google+Share on FacebookShare on LinkedInShare on TwitterShare on DiggShare on Stumble Upon
Custom Search
 
  
 
2-7 Figure 2-7.—Cutoff in a conventional tube. In view B, a bias voltage of -6 volts is applied to the grid. As you can see, some of the electrostatic lines of force are attracted to the negatively charged grid wires while the rest pass through the grid spacings. Because there are fewer lines of force reaching the cathode, there are fewer paths for electrons to use to reach the plate. As a result, conduction through the tube is decreased. In view C, the negative potential of the grid has been raised to -20 volts, which drives the tube into cutoff. All of the electrostatic lines of force terminate at the negatively charged grid, instead of continuing on to the cathode. The electrons emitted by the cathode will not feel the electrostatic attractive force of the positively charged plate. Under these conditions, current cannot flow through the tube. Now look at figure 2-8. Here you see a diagram of a variable-mu, or remote-cutoff, tube. The only difference between the remote-cutoff tube depicted and the sharp-cutoff tube is in the grid wire spacing. In the conventional sharp-cutoff tube, the grid wires are evenly spaced, while in the remote-cutoff tube the grid wires in the middle of the grid are placed relatively far apart. This is shown in view A.


Electrical News
Become a Measurement Master
Becoming a measurement master, like anything else, takes time and...
eetimes.com
Ten Flash Drives That Will Turn Heads (and Store Your Data!)
Today's flash drives have come a long way with iconic...
eetimes.com
10 Tech Gifts to Buy Your Engineer for Christmas
Here is a list of last minute ideas for making...
eetimes.com
Holiday Movies to Geek Out About
EE Times wants to ensure domestic bliss with a handy...
eetimes.com
Road to Auto Market Paved With Fault-Tolerant SoCs
Data protection and redundancy features implemented across entire SoC designs...
eetimes.com
Boston-Area Engineers to Share Expertise at ESC Boston 2015
In an exciting new session format at ESC Boston 2015,...
eetimes.com
Memory Design Trends in 2014
Memory transitions, increased-density drive design trends: Customers are looking for...
eetimes.com
True 3-D Chips Harness Nanotubes
Stanford University has learned how to stack any number of...
eetimes.com
Top 15 Analog, MEMS & Sensors News From 2014
From faulty MEMS mics to NXP's labor disputes, here are...
eetimes.com
Space Weather Satellite Set for Launch
NOAA's Deep Space Climate Observatory will serve as an early...
eetimes.com
Hackers Go Off-Grid for Power
Hackathon produces designs that could be assembled by villagers with...
eetimes.com
Ten Hot & Cool NASA Innovations
Partnering with industry, NASA has developed new technologies that are...
eetimes.com
The Circle – The Future's Imperfect in the Present Tense
Dystopian novel satirizes mega-Google companies and the modern techie ethos....
eetimes.com
Friday Quiz: S-Parameters
S-Parameters are no longer just for microwave engineers. High-speed digital...
eetimes.com
EEVblog #694 – Mailbag
Mailbag that’s not on a Monday, because Dave has been...
eevblog.com
So Much To Do, So Little Time
2015 will likely be the year of widespread awareness and...
eetimes.com
What Does It Take to Truly Leapfrog With Technology?
In January 2015, Lindsay Craig will be teaching technology workshops...
eetimes.com
Recommended Reads From the Engineer's Bookshelf
Are you wondering what to buy your family and friends...
eetimes.com
Successful With Phones & Drones, Parrot Ponders Farming
Parrot is a 20-year-old startup that has the passion of...
eetimes.com
Power Week: Popular Gaming Consoles' Energy Use Compared
Just in time for the holidays, engineers at the Electric...
eetimes.com
 


Privacy Statement - Copyright Information. - Contact Us

comments powered by Disqus

Integrated Publishing, Inc.
9438 US Hwy 19N #311 Port Richey, FL 34668

Phone For Parts Inquiries: (727) 755-3260
Google +